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Scanning Probe Microscopy gives an opportunity to carry out studies of spatial, physical and chemical properties of objects with the typical dimensions of less than a few nanometers. Owing to its multifunctionality, availability and simplicity, Atomic-Force Microscope (AFM) has become one of the most prevailing "tools for nanotechnology" nowadays. NTEGRA platform has been designed as the special base for the constantly developing options of Scanning Probe Microscopy that combines them with various other modern research methods.

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NT-MDT

Building 100, Zelenograd, Moscow 124482, Russia

nt-mdt@made-in-zelenograd.com

Scanning Probe Microscope (SPM) platform is designed for the study of properties of the surface at nanometer scale. It allows visualizing and perform quantitative measurements of mechanical (hardness, elasticity, viscidity), electrical (conductivity, capacity, distribution of surface charge) and magnetic properties of the sample working with sizes from several microns to angstrom. Solver can operate with more than 40 measuring methods, which may be carrying out in air as well as in the controlled atmosphere and liquids.

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NT-MDT

Building 100, Zelenograd, Moscow 124482, Russia

nt-mdt@made-in-zelenograd.com

NT-MDT offers a wide assortment of Scanning Microscopy probes.

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NT-MDT

Building 100, Zelenograd, Moscow 124482, Russia

nt-mdt@made-in-zelenograd.com

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