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NT-MDT

Building 100, Zelenograd, Moscow 124482, Russia

nt-mdt@made-in-zelenograd.com

SOLVER NEXT

The newest NT-MDT development Solver Next is the first to offer a new concept in general purpose Scanning Probe Microscope. This new design offers "on-board expertise" opening the way for all user levels to acquire quality SPM images in a short amount of time.

SMENA

The compact portable Scanning Probe Microscope for stand alone analysis of samples with unlimited sizes. This microscope driven by a notebook will help to reveal nano-scale properties of any large objects even outdoors.

SOLVER P47-PRO

The simple and reliable Scanning Probe Microscope for routine surface analysis. Sample size is limited in this model for the sake of high resolution.

SOLVER P47H-PRO

The simple and reliable Scanning Probe Microscope for routine surface analysis. It is especially adopted for the analysis of large and heavy samples (up to 100x100x20mm and 300g).

SOLVER PRO-M

The universal platform for the modern and powerful research grade SPMs. The instrument opens up new horizons for the thorough investigation of different kinds of samples, delivering resolutions on the atomic/molecular scale in air, gas and liquid environments as well as the opportunity to use almost any known scanning probe microscopy technique. Powerful controller, sensor-based closed-loop operation and 1 ?m optics are the most important tips.

SOLVER HV-MFM

The SOLVER HV-MFM is a new model of high vacuum scanning probe microscope. The device is intended for investigations in high vacuum conditions (up to 10-8 Torr) and rare gaseous unaggressive medium.

General information

SOLVER NEXT is the state-of-the-art NT-MDT development, designed to meet a researcher’s current and future needs. This innovative device at the forefront of scientific research opens up new paths of study in different fields of nanotechnology, providing all user levels with a full range of conventional SPM measuring techniques (such as topography, phase imaging, nanolithography and more).

The novel dual head system of the Solver Next offers both atomic force (AFM) and scanning tunnelling microscopy (STM) under one hood. This enables researchers to gain the fastest time to results, excellent performance, increased accuracy, high reliability and unprecedented ease-of-use with no loss in resolution. The flexible, sleek and functional system incorporates smart software, automated head exchange, and motorized sample positioning under video monitored control. This allows for high quality images without the need for specially trained operators.

The system has closed-loop sensors to compensate for inherent piezoelectric imperfections such as scan nonlinearity, creep and hysteresis. With two additional removable heads for operating in liquid environments and nanoindentation you have the freedom to work with a variety of samples, measuring modes and conditions.

The Solver Next has an advanced controller with a vast library of scripts and MAC® compatibility. The result is a image-friendly operating system well-suited to large file, 3-dimensional mathematics and manipulation.

The Solver Next provides a robust, diverse, and economic solution for classroom, industrial, routine biological and pharmaceutical labs, and makes AFM and STM accessible to a broader audience, even offering a special iPhoneTM applet for simple image analysis and image sharing.

Key features

  • HeadHiPEX™ (Head High Precision Exchange) system is intended for measuring head management. HeadHiPEX™ is a completely automated system able to change built-in and external measuring heads maintaining their position under the sample with very high precision
  • Automatic multifunctional enclosure IsoShield™ system which is keeping samples in highly homogenous environment, like uniform temperature field, constant and controllable humidity, negligible level of parasitic electromagnetic fields and electrostatic free staging. The system incorporates an additional safety feature for users that disables the laser beam automatically when the door is open
  • Precision Instrument Navigation System PINpoint™ provides easy-to-use navigation allowing precision sample and optical viewing system positioning
  • ExpertFBA™ (Expert Fine Beam Alignment System) is a fully automated system for the perfect alignment of the cantilever, laser and photodiode
  • Electronic adjustment system of scanning field size ScanScaler™ provides easy-to-manage automatic adjustment of scan mode between large (up to 100 um) and small (atomiń scale) samples
  • Automated alignment of optical feedback geometry (cantilever–laser–photodiode)
  • Motorized focus and zoom of the optical view
  • Automated software driven control of measurement modes
  • All basic Atomic Force Microscopy techniques — topography, phase imaging, measurement of electric properties, nanolithography and more
  • Scanning Tunneling Microscopy
  • Wide range of operating conditions for experimentation — in air or liquid
  • Low-noise capacitive closed-loop feedback in all three directions (XYZ) provides precision Nanometrology
  • Atomic resolution

Special application

The Solver Next is equipped with a special appllication for exporting images to the iPhone™ - MDTServer™ , where they can be viewed dynamically in 2D or 3D, and easily shared with colleagues or classmates at school, in a technical meeting or with fellow workers in different locations around an industrial facility. The applet also includes more routine image analysis capabilities such as linear and roughness measurements and plane subtraction etc.

General information

Stand Alone SMENA expands the scope of SPM to bring you innovative facilities for the investigation of samples with unlimited size in most available SPM measuring modes. In spite of such versatile measuring capabilities, Stand Alone SMENA has a very compact low weight design and reasonable price. SPM SMENA consists of a stand alone measuring head and an electronic module connected to a laptop or a PC by means of an interface board. This nice compact and portable device driven by a notebook will help to reveal nano-scale properties of any large objects even outdoors.

When the sample size is limited to 100x100x20 mm it is possible to use SMENA with the positioning stage. That brings the possibility to fix the sample on the magnet holder and position the tip over the sample surface in the range of 5x5 mm with 5 ?m resolution. It is also easy to upgrade SMENA to Solver P47H-PRO and Solver PRO-M systems.

Key features

  • Portable compact Atomic Force Microscope
  • Compatible with a laptop
  • Wide range of SPM methods
  • Low power consumption (less than 60 W)

Applications

  • Optical and Magnetic Storage, Coating and Polishing Quality Control, Large Optics, Polymers, Biology and Medicine, Semiconductors, Materials Science and many others.

Optional features

  • Using additional units, one may turn Smena into SOLVER P47H-PRO and SOLVER PRO-M systems

General information

The SOLVER P47-PRO SPM is a universal tool for the complex research of different objects in air, liquid and controlled gas environments with sample heating up to 130°C. Scanning-by-sample scheme realized in the microscope provides the highest resolution in the class. Time-proven technical solutions are the base for high reliability and measurement accuracy. The construction makes the work with the system pleasant and easy. It can be used for routine measurements in small companies and university laboratories as well as in big research centers.

Key features

  • Device has its own vibration isolation system for obtaining ultra-high resolution (up to atomic) without additional vibration isolation
  • Scanning Tunnel Microscopy, Atomic-Force Microscopy and Shear Force (the method that allows using optical fiber as a probe) combined in one device
  • Study in liquids, controlled gas environment and in temperatures up to 150îŃ
  • Interactive management system and software setting of modes and functional scheme of device
  • Saving settings to separate files allows a beginner working with almost any of the available up-to-date methods of scanning probe microscopy
  • Skilled user may design and implement his own methods, including multipass ones

Applications

Measuring modes

  • In air:STM/low current STM/STS/contact AFM/LFM/Resonant Mode(semicontact AFM+noncontact AFM)/Phase Imaging/Force Modulation/Spreading Resistance Imaging/MFM/EFM/SCM/SKM/Adhesion Force Imaging/Shear Force/AFM (Force + Voltage), STM and RM Lithographies
  • In liquid: Contact AFM/LFM/Force Modulation/Adhesion Force Imaging/semicontact (scanner-driven) AFM/AFM (Force) Lithography

Applications

  • Materials science
  • Nanometrology
  • Spectroscopy
  • Medicine
  • Biology
  • Semiconductors
  • Thin Films and Data Storage

General information

SPM SOLVER P47H-PRO features its versatility. The number of available measurement and influence methods and modes is huge. Scanning-by-probe scheme allows characterization of samples with sizes up to 100x100x20mm and weight 300 g. The model can be adopted for measurements in a controlled gas environment, in liquids, with sample heating up to 130°C. The AFM head can be easily removed for Stand Alone operation allowing samples with unlimited sizes to be measured.

Key features

  • Device has its own vibration isolation system for obtaining ultra-high resolution (up to atomic) without additional vibration isolation
  • Capability of study of large samples with size up to100ő100ő20mm
  • Scanning Tunnel Microscopy, Atomic-Force Microscopy and Shear Force (the method that allows using optical fiber as a probe) combined in one device
  • Study in liquids, controlled gas environment and in temperatures up to 150îŃ
  • Interactive management system and software setting of modes and functional scheme of device
  • Saving settings to separate files allows a beginner working with almost any of the available up-to-date methods of scanning probe microscopy
  • Skilled user may design and implement his own methods, including multipass ones

Applications

Measuring modes

  • In air: STM/ STS/ Contact AFM/ LFM/Semicontact AFM/Noncontact AFM/ Phase Imaging/ Force Modulation mode/ Spreading Resistance Imaging/ MFM/ EFM/ SCM/ SKM/ Adhesion Force Imaging/ Shear force/ AFM (Force + Voltage) Lithography, STM Lithography, RM Lithography/
  • In liquid: Contact AFM/ LFM/ Semicontact AFM/ Phase Imaging/ Force Modulation mode/ Adhesion Force Microscopy/ AFM (Force) Lithography

Applications

  • Materials Science
  • Nanomanipulation
  • Nanolithography
  • Semiconductors
  • Spectroscopy
  • Optical and Magnetic Storage Development
  • Thin Films
  • Medicine and Biology
  • Polymers

General information

SOLVER PRO-M is a powerful and well-designed universal scientific Scanning Probe Microscope applicable to almost all areas that SPM can ever be exploited in. Some features make it unique in terms of electronics capability, probe movement precise measurements, and optical system convenience.

The SOLVER PRO-M model has been suited to be driven by the new-generation controller. It has been designed to incorporate modern achievements in microelectronics. Elegant module architecture and many new design solutions allowed creating one of the most powerful "brain" that SPM ever possessed. It contains more than 10 000 components from the world-best manufacturers as Analog Devices, Burr Brown etc. Very important feature is that the new controller is perfectly suited to work with high frequencies (up to 5 MHz). Thus it is compatible with high frequency cantilevers that can be required to obtain the best quality images. High frequency compliance measurements are also important to perform AFAM (Atomic Force Acoustic Microscopy) – NT-MDT unique microscopy technique for imaging samples with differences in local stiffness. The controller is also designed to process capacitive sensors feed-back signal providing precision scanning. Closed-loop control is used to improve the scanning performance and to expand the instrument functionality. Some scanners are equipped with low-noise capacitive XYZ sensors that provide precise positioning by measuring the exact scanner movement. Integrated low-noise capacitive sensors allow high resolution measurements with sensors switched on for down to 50–100 nm scan size. SOLVER PRO-M can be supplied with 1 ?m resolution optics set enabling to search and see individual objects on the sample surface separated by 1 ?m distance from each other.

Key features

  • Open design, modularity
  • Capability of investigating small and large samples; in Stand Alone mode the sample’s size is almost unlimited
  • Large XYZ scanning range (up to 150ő150ő15 µm for some configurations)
  • Capability of obtaining atomic and molecular resolution in the air and in the liquids in contact AFM modes, semi-contact AFM, STM (non-conducting liquids)
  • Universal holder allows using all kinds of cantilevers, including self-made by the user for a certain task
  • Capability of working in many modes with one probe without hardware reset since all the settings are software controlled
  • Integrated, convenient in setting and use optical video system with resolution of 1 µm
  • Build-in subprogram Smart Software for automatization and simplification of program preparation for measurements

Applications

Measuring modes

  • In ambient air: STM/ STS/ AFM (contact + noncontac + semicontact)/ LFM/ Phase Imaging/ Force Modulation mode/ Spreading Resistance Imaging/ MFM/ EFM/ SCM/ Kelvin mode/ Adhesion Force Imaging/ AFAM/ AFM Lithographies: Force (scratching + dynamic plowing), Current (Local Anodic Oxidation), STM
  • In liquid: AFM (contact + semicontact)/ LFM/ Phase Imaging/ Force Modulation mode/ Adhesion Force Imaging/ AFM Lithography

Applications

  • New materials
  • Thin films
  • Polymers
  • Semiconductors
  • Biological samples
  • Any other applications which require atomic or molecular resolution in air, gas or fluid environments, as well as in-situ examination of structural changing on the sample surface during heating.

Optional features

  • Combination of AFM and nanoindentation functions for study of mechanical properties and hardness of the sample
  • Excellent contrast image of distribution of hardness on soft and hard samples; capability of determining numeric values of Young modulus when working in Atomic-Force Acoustic Microscopy mode

General information

The SOLVER HV-MFM is a new model of high vacuum scanning probe microscope created on the basis of the SOLVER HV. The device is allowed to run qualitative and quantitative measurements in high vacuum conditions and rare gaseous unaggressive medium.

The SOLVER HV-MFM – is an ideal tool for investigations in high vacuum conditions. Limiting pressure about 8?10 -8 Torr can be provided by vacuum system. Owing to the high vacuum operation, it makes it possible to increase the cantilever sensitivity, thereby raising the accuracy of measurements of weak forces which is especially important on application of highly sensitive magnetic measurements, Kelvin probe microscopy and scanning capacitance microscopy.

The use of water for cooling electromagnet is allowed to substantially increase the action of magnetic field.

The low level of thermal drifts in the measuring head, playing a significant part in the investigations in the terms of changing temperature, is provided by the preamplifiers with reduced heat generation and by the temperature compensators.

An opportunity to visual observations of measurement process in vacuum chamber is offered by videomicroscope with automatic control. Video surveillance is supported by CCD camera and monitor.

Vibration-isolating system consists of active and passive vibration isolation.

A great number of flanges is enclosed in the vacuum chamber. It makes it possible as the need arises to install supplementary equipment such as devices for modification nano-structures in high vacuum conditions by ion, electronic and plasma sources.

The design of the SOLVER HV-MFM was optimized in accordance with the requirements of ergonomics. It is convenient for research in the laboratory environment. Four wheels and four adjustable legs give an opportunity to solve a problem with device movement with minimal efforts.

Reliable and high quality the SOLVER HV-MFM is perfect for research surface and near-surface properties with nanometer resolution in high vacuum conditions.

Key features

  • Operation in a controlled atmosphere and in vacuum down to 5*10-8 Torr
  • Water-cooling electromagnet is allowed to run measurements in the magnetic field over a long period of time
  • Owing to the minimization of the thermal drifts and effective combination of the passive and active vibration isolation, high spatial resolution is achieved
  • Special coating of the chamber is enabled to work without preliminary warming of the chamber with small desorption
  • A specially coated chamber allows the user to work in weak desorption conditions without preliminary chamber warm-up
  • The enhanced cantilever q-factor leads to high sensitivity of the electric field and magnetic field measurements (more than 10 times as compared to usual terms)
  • High resolution nanolithography
  • Bypass pumping from the chamber
  • Small chamber makes possible to obtain much faster low pressure
  • Much less time required for system and controller preparation than with Ultrahigh vacuum systems

Optional features

  • Controlled sample cooling – up to 50 K and controlled sample heating – up to 150 ?C. Temperature stability – 0,1 ?C
  • Bypass pumping from the chamber
  • Water-cooling electromagnet

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